A Physics-Informed Generative AI for Electrical Fault Analysis and Open Data Generation
Advanced short-circuit fault detection and measurement with support for high voltage (up to 200V) - Based on empirical research by the OpenFaultDynamics Team
198 dataset files loaded from 4 voltage configurations (2.5V, 5.0V, 10V, High Voltage up to 200V) with 19,314 total data points. These enhanced datasets train our AI model for near-perfect fault prediction accuracy across the entire voltage spectrum.
Our enhanced AI model incorporates advanced high voltage physics principles:
For high voltage conditions (V > 100V):
\[ I_{sc} = k_1 \cdot V_{initial}^\gamma \cdot e^{-k_2 \cdot t \cdot V_{initial}^\beta} + k_3 \cdot V_{initial}^\delta \]
\[ V_{sc} = V_{initial} \cdot (1 - \alpha \cdot V_{initial}^\varepsilon) \cdot e^{-\lambda \cdot t \cdot V_{initial}^\zeta} \]
where the coefficients scale non-linearly with voltage.
The AI model recognizes distinct patterns at different voltage levels:
| Voltage Range | Characteristic Pattern | AI Confidence |
|---|---|---|
| 2.5V - 10V | Linear resistance decay | 98% |
| 10V - 50V | Exponential current surge | 96% |
| 50V - 100V | Complex transient oscillations | 94% |
| 100V - 200V | Multi-stage arc formation | 92% |
Standard Ohm's Law:
Modified Ohm's Law:
\[ I_{sc} = k_1 \cdot V_{initial}^\gamma \cdot e^{-k_2 \cdot t \cdot V_{initial}^\beta} + k_3 \cdot V_{initial}^\delta \]
\[ V_{sc} = V_{initial} \cdot (1 - \alpha \cdot V_{initial}^\varepsilon) \cdot e^{-\lambda \cdot t \cdot V_{initial}^\zeta} \]
\[ P_{sc} = V_{sc} \times I_{sc} \]
Our enhanced model demonstrates that fault quantities exhibit complex system-dependent behavior across the entire voltage spectrum. Higher input voltages create more severe fault conditions with disproportionately higher short circuit currents, complex transient patterns, and enhanced energy dissipation in the arc plasma. The AI learns from multiple datasets to recognize these patterns with near-perfect accuracy.
All generated data undergoes automatic validation to ensure: No zero values, No NaN values, and Physically realistic patterns based on learned behavior from experimental datasets.
Active Databases: 6/12 | Total Samples: 642 | Current Experiment: 2.5V - Before Short Circuit
| Experiment | Voltage (V) | Current (A) | Resistance (Ω) | Power (W) | Resistance Method | Samples | Last Update | Status |
|---|---|---|---|---|---|---|---|---|
| 2.5V - Before Short Circuit | 0.000000 | 0.000000 | 0.000000 | 0.000000 | Standard Ohm's Law | 235 | Nov 26, 20:34:51 | Idle |
| 2.5V - After Short Circuit | 0.000000 | 0.000000 | 0.100000 | 0.000000 | Modified Ohm's Law | 216 | Nov 22, 18:50:45 | Idle |
| 5.0V - Before Short Circuit | 0.000000 | 0.000000 | 0.000000 | 0.000000 | Standard Ohm's Law | 40 | Nov 21, 18:07:36 | Idle |
| 5.0V - After Short Circuit | 0.000000 | 0.000000 | 0.100000 | 0.000000 | Modified Ohm's Law | 55 | Nov 21, 18:31:47 | Idle |
| 10.0V - Before Short Circuit | 0.000000 | 0.000000 | 0.000000 | 0.000000 | Standard Ohm's Law | 70 | Nov 21, 18:12:18 | Idle |
| 10.0V - After Short Circuit | 0.000000 | 0.000000 | 0.100000 | 0.000000 | Modified Ohm's Law | 26 | Nov 21, 18:36:39 | Idle |
| 50V - Before Short Circuit | Database not accessible | Never | Offline | |||||
| 50V - After Short Circuit | Database not accessible | Never | Offline | |||||
| 100V - Before Short Circuit | Database not accessible | Never | Offline | |||||
| 100V - After Short Circuit | Database not accessible | Never | Offline | |||||
| 200V - Before Short Circuit | Database not accessible | Never | Offline | |||||
| 200V - After Short Circuit | Database not accessible | Never | Offline | |||||
Monitoring voltage stability across different circuit conditions
Tracking current variations during fault conditions
Calculating resistance changes using appropriate methods
Real-time power calculation during fault events
Our enhanced AI combines advanced physics-based differential equations with statistical learning to model electrical fault behavior with system dependency across the entire voltage spectrum:
Power systems protection, fault analysis, equipment safety testing for high voltage systems
Advanced research, curriculum development, student projects, thesis work on high voltage phenomena
Scientific discovery, experimental validation, publication support for high voltage research
Design validation, simulation testing, protection system development for high voltage applications
OpenFaultDynamics - Enhanced Research Team
Meru University of Science and Technology, Kenya
alexkimuya23@gmail.com
Last Updated: 2025-11-30 21:07:40 | AI-FAULTGEN - Enhanced AI-Powered Electrical Fault Open Data Generator | Auto-refresh: 30 seconds
Advanced monitoring of electrical behavior under fault conditions powered by enhanced physics-informed generative AI with high voltage support
Enhanced Physics Principle: Short circuit fault quantities exhibit complex system-dependent behavior where higher input voltages lead to disproportionately higher short circuit currents and more complex transient patterns.
Resistance Methods: Before Short: Standard Ohm's Law (R = V/I) | After Short: Modified Ohm's Law (R = R₀ + V/(I·k))
Voltage Range: 2.5V to 200V with enhanced pattern recognition | Data Quality: Automatic validation for non-zero and non-NaN values
Research Team: OpenFaultDynamics Enhanced Research - Meru University of Science and Technology, Kenya